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Time-resolved imaging of lateral charge carrier transport in photovoltaic absorbers (Conference Presentation)
Author(s): Adrien Bercegol; Daniel Ory; Laurent Lombez
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Paper Abstract

Time-resolved fluorescence imaging (TR-FLIM) allows to obtain time-resolved photoluminescence maps with a micrometric resolution. We showed last year that wide-field illumination with TR-FLIM allows to observe lateral transport to a more defective zone. This study will be focused on point and structured illumination, extending the breadth of this characterization technique to bare & homogeneous absorbers. We explore this new possibility by presenting applications for a wide range of semi-conductors. By treating the datacubes with algorithms solving 2D/3D drift-diffusion equations, we derive optoelectronic properties representative for lateral diffusion and local recombination properties.

Paper Details

Date Published: 8 March 2019
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Proc. SPIE 10913, Physics, Simulation, and Photonic Engineering of Photovoltaic Devices VIII, 1091303 (8 March 2019); doi: 10.1117/12.2511716
Show Author Affiliations
Adrien Bercegol, Electricité de France (France)
Institut Photovoltaïque d'Ile-de-France (France)
Daniel Ory, EDF Recherche & Développement (France)
Institut Photovoltaïque d'Ile-de-France (France)
Laurent Lombez, Institut Photovoltaïque d'Ile-de-France (France)
CNRS (France)


Published in SPIE Proceedings Vol. 10913:
Physics, Simulation, and Photonic Engineering of Photovoltaic Devices VIII
Alexandre Freundlich; Laurent Lombez; Masakazu Sugiyama, Editor(s)

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