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Process optimization: internal feature measurement for additive-manufacturing parts using x-ray computed tomography
Author(s): Dawei Xu; Fang Cheng; Yu Zhou; Thaddie Matalaray; Pei Xian Lim; Liping Zhao
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Paper Abstract

X-ray computed tomography (CT) is a non-destructive approach to verify internal features of various industrial components built by additive manufacturing (AM) or other processing methods. However, the measurement results was highly impacted by numerous factors. In this study, DoE (Design of Experiments) was conducted to statistically study impacts of error source of X-ray CT metrology; optimal settings were recommended for different internal geometrical features. Measurement comparison between X-ray CT and CMM (Coordinate Measuring Machine) is also provided in this paper to analyze the principle difference of these two measurement technology.

Paper Details

Date Published: 7 March 2019
PDF: 6 pages
Proc. SPIE 11053, Tenth International Symposium on Precision Engineering Measurements and Instrumentation, 110530H (7 March 2019); doi: 10.1117/12.2511429
Show Author Affiliations
Dawei Xu, Advanced Remanufacturing Technology Ctr. (Singapore)
Fang Cheng, Advanced Remanufacturing Technology Ctr. (Singapore)
Yu Zhou, Advanced Remanufacturing Technology Ctr. (Singapore)
Thaddie Matalaray, Advanced Remanufacturing Technology Ctr. (Singapore)
Pei Xian Lim, Advanced Remanufacturing Technology Ctr. (Singapore)
Liping Zhao, National Metrology Ctr. (Singapore)

Published in SPIE Proceedings Vol. 11053:
Tenth International Symposium on Precision Engineering Measurements and Instrumentation
Jiubin Tan; Jie Lin, Editor(s)

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