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3D scanning by means of dual-projector structured light illumination
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Paper Abstract

This paper introduces a dual-projector phase measuring profiler that adds a second projector to a traditional structured light illumination system to improve the overall quality of 3D scanning. With this method, two projectors are synchronized to a single camera, but each one projects structured light patterns of a unique frequency. The system performance benefits from a wider projection angle and doubled light intensity. In particular, a detailed system implementation in hardware is described. Moreover, the major difference between the phase unwrapping of our dual-projector system versus a single-projector system is discussed with a LUTbased phase unwrapping scheme proposed.

Paper Details

Date Published: 4 March 2019
PDF: 9 pages
Proc. SPIE 10932, Emerging Digital Micromirror Device Based Systems and Applications XI, 109320M (4 March 2019); doi: 10.1117/12.2510990
Show Author Affiliations
Ying Yu, Univ. of Kentucky (United States)
Daniel L. Lau, Univ. of Kentucky (United States)
Matthew P. Ruffner, Univ. of Kentucky (United States)


Published in SPIE Proceedings Vol. 10932:
Emerging Digital Micromirror Device Based Systems and Applications XI
Michael R. Douglass; John Ehmke; Benjamin L. Lee, Editor(s)

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