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Characterization of performance of back-illuminated SCMOS cameras versus conventional SCMOS and EMCCD cameras for microscopy applications
Author(s): Justin Cooper; Alan Mullan; Aleksandra Marsh; Marcin Barszczewski
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Paper Abstract

Selecting a camera can be a difficult due to the different technologies available and the range of different camera models. Technical specifications of different camera technologies vary, sometimes by several orders of magnitude, or sometimes by a seemingly small amount, and it is not clear how these differences affect camera performance for a specific application. The key to selecting the most suitable camera is by combining several key specifications with the needs of the specific application. The important parameters that influence how well suited a camera will be for a specific application can be identified as: sensitivity, speed, field of view and in some cases, low dark noise. A further subset of factors such as: dynamic range, shuttering modes, connectivity or vibration can also be used to determine suitability. This information should simplify the decision tree allowing for flexibility that may be needed in multi-user, multiapplication/ technique environment spanning often radically different light regimes and sample sensitivities. Recently cameras based on back-illuminated sCMOS technology have become available which offer further improvements in sensitivity. This provides a further option for consideration to the existing sCMOS and EMCCD cameras available. Considering this new camera technology, we will characterize the new sCMOS camera model within the wider context of the camera technologies and other models available.

Paper Details

Date Published: 4 March 2019
PDF: 8 pages
Proc. SPIE 10925, Photonic Instrumentation Engineering VI, 109251C (4 March 2019); doi: 10.1117/12.2510614
Show Author Affiliations
Justin Cooper, Andor Technology Ltd. (United States)
Alan Mullan, Andor Technology Ltd. (United States)
Aleksandra Marsh, Andor Technology Ltd. (United Kingdom)
Marcin Barszczewski, Andor Technology Ltd. (United States)

Published in SPIE Proceedings Vol. 10925:
Photonic Instrumentation Engineering VI
Yakov G. Soskind, Editor(s)

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