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Compressed ultrafast transmission electron microscopy: a simulation study
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Paper Abstract

Bringing ultrafast temporal resolution to transmission electron microscopy (TEM) has historically been challenging. Despite significant recent progress in this direction, it remains difficult to achieve sub-nanosecond temporal resolution with a single electron pulse imaging. To address this limitation, here, we propose a methodology that combines laserassisted TEM with computational imaging methodologies based on compressed sensing (CS). In this technique, a twodimensional (2D) transient event [i.e. (x, y) frames that vary in time] is recorded through a CS paradigm. The 2D streak image generated on a camera is used to reconstruct the datacube of the ultrafast event, with two spatial and one temporal dimensions, via a CS-based image reconstruction algorithm. Using numerical simulation, we find that the reconstructed results are in good agreement with the ground truth, which demonstrates the applicability of CS-based computational imaging methodologies to laser-assisted TEM. Our proposed method, complementing the existing ultrafast stroboscopic and nanosecond single-shot techniques, opens up the possibility for single-shot, spatiotemporal imaging of irreversible structural phenomena with sub-nanosecond temporal resolution.

Paper Details

Date Published: 21 February 2019
PDF: 6 pages
Proc. SPIE 10883, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVI, 108831F (21 February 2019); doi: 10.1117/12.2510394
Show Author Affiliations
Xianglei Liu, Institut National de la Recherche Scientifique (Canada)
Shian Zhang, East China Normal Univ. (China)
Aycan Yurtsever, Institut National de la Recherche Scientifique (Canada)
Jinyang Liang, Institut National de la Recherche Scientifique (Canada)


Published in SPIE Proceedings Vol. 10883:
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XXVI
Thomas G. Brown; Tony Wilson, Editor(s)

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