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Pulse-by-pulse single-shot optical spectrum analyzer developed on a single platform
Author(s): Hideaki Furukawa; Takeshi Makino; Xiaomin Wang; Tetsuya Kobayashi; Bahram Jalali; Dale Capewell; Mohammad H. Asghari; Wai Sing Man; Kwong Shing Tsang; Naoya Wada
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Paper Abstract

Pulse-by-pulse single-shot spectrum measurement can be realized using the time stretch dispersive Fourier Transform technique. In this paper, we report a fully integrated and modular pulse-by-pulse single-shot optical spectrum analyzer (PS-OSA) system. Many modules including a picosecond gain-switched laser, multiple fibers with different chromatic dispersions, high-power optical amplifiers, a clock-generator, a photodetector and a digitizer are integrated into a main-frame. These modules are standard in size and can be replaced to improve the performance or changed to adapt the system to different applications. Here, we present the specification of this single-platform PS-OSA and successfully demonstrate high throughput measurement of the transmission spectrum of electroabsorption optical modulators with 11.7 ns refresh time.

Paper Details

Date Published: 4 March 2019
PDF: 6 pages
Proc. SPIE 10903, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IV, 109030E (4 March 2019); doi: 10.1117/12.2510008
Show Author Affiliations
Hideaki Furukawa, National Institute of Information and Communications Technology (Japan)
Takeshi Makino, National Institute of Information and Communications Technology (Japan)
Xiaomin Wang, Optoquest Co., Ltd. (Japan)
Tetsuya Kobayashi, Optoquest Co., Ltd. (Japan)
Bahram Jalali, Univ. of California, Los Angeles (United States)
Dale Capewell, Roguescope (United States)
Mohammad H. Asghari, Loyola Marymount Univ. (United States)
Wai Sing Man, Amonics Ltd. (Hong Kong, China)
Kwong Shing Tsang, Amonics Ltd. (Hong Kong, China)
Naoya Wada, National Institute of Information and Communications Technology (Japan)


Published in SPIE Proceedings Vol. 10903:
Real-time Measurements, Rogue Phenomena, and Single-Shot Applications IV
Daniel R. Solli; Georg Herink; Serge Bielawski, Editor(s)

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