Share Email Print
cover

Proceedings Paper

Nematic thin layer self-organization caused by semiconductor surface superlattice
Author(s): Alexander P. Fedtchouk; Ruslana A. Rudenko; Larisa D. Shevchenko; Yuri Kornienko
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

We have examined experimentally the parameters of the photo- e.m.f. generated in the system containing the monocrystalline semiconductor and thin layer of nematic liquid crystal (NLC). Registered maxima quantity perfectly correlates with the ordering axis number. The present paper shows one of the ways of biaxial molecular ordering in NLC not registered before. It was shown also that the proposed method is both applicable as to the semiconductor surface superlattice symmetry type analysis and also to the ordered LC molecules concentration evaluation.

Paper Details

Date Published: 13 September 1996
PDF: 8 pages
Proc. SPIE 2877, Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III, (13 September 1996); doi: 10.1117/12.250941
Show Author Affiliations
Alexander P. Fedtchouk, Odessa State Univ. (Ukraine)
Ruslana A. Rudenko, Odessa State Univ. (Ukraine)
Larisa D. Shevchenko, Odessa State Univ. (Ukraine)
Yuri Kornienko, Odessa State Univ. (Ukraine)


Published in SPIE Proceedings Vol. 2877:
Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III
Damon K. DeBusk; Ray T. Chen, Editor(s)

© SPIE. Terms of Use
Back to Top