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A compact DUV spectrometer for wide-temperature entry, descent, and landing sensing applications
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Paper Abstract

NASA has described the need for rugged, compact spectrometers for deep ultraviolet (DUV) analysis of atmospheric properties during the entry, descent, and landing (EDL) phase of the mission profile for planetary landing craft. The EDL phase presents a brief opportunity to gather useful altitude profiles of atmospheric components and pressures. However, EDL is a high-risk phase and presents severe challenges to instrument design, including large temperature changes over short periods and payload restrictions. Therefore, the preferred features of an EDL spectrometer are compact design, stable performance across wide temperatures, DUV sensitivity, and simple temperature management systems. In this paper, a compact EDL spectrometer is described, which includes the system-level optical design and analysis of the novel silicon-carbide integrated circuits.

Paper Details

Date Published: 4 March 2019
PDF: 9 pages
Proc. SPIE 10925, Photonic Instrumentation Engineering VI, 1092510 (4 March 2019); doi: 10.1117/12.2508656
Show Author Affiliations
Waylin J. Wing, LumenFlow Corp. (United States)
Jim Holmes, Ozark Integrated Circuits, Inc. (United States)
Nicholas Chiolino, Ozark Integrated Circuits, Inc. (United States)
Paul Bourget, LumenFlow Corp. (United States)
Sonia Perez, Ozark Integrated Circuits, Inc. (United States)
Matthew Barlow, Ozark Integrated Circuits, Inc. (United States)
A. Matt Francis, Ozark Integrated Circuits, Inc. (United States)

Published in SPIE Proceedings Vol. 10925:
Photonic Instrumentation Engineering VI
Yakov G. Soskind, Editor(s)

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