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Ultrafast linear array detector for real-time imaging
Author(s): M. Caselle; Lorenzo Rota; A. Kopmann; S. A. Chilingaryan; M. Mahaveer Patil; W. Wang; E. Bründermann; S. Funkner; M. Nasse ; G. Niehues; M. Norbert Balzer; M. Weber; A. S. Müller; S. Bielawski
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Paper Abstract

KALYPSO is a novel detector operating at line rates above 10 Mfps. It consists of a detector board connected to FPGA based readout card for real time data processing. The detector board holds a Si or InGaAs linear array sensor, with spectral sensitivity ranging from 400 nm to 2600 nm, which is connected to a custom made front-end ASIC. A FPGA readout framework performs the real time data processing. In this contribution, we present the detector system, the readout electronics and the heterogeneous infrastructure for machine learning processing. The detector is currently in use at several synchrotron facilities for beam diagnostics as well as for single-pulse laser characterizations. Thanks to the shot-to-shot capability over long time scale, new attractive applications are open up for imaging in biological and medical research.

Paper Details

Date Published: 1 March 2019
PDF: 9 pages
Proc. SPIE 10937, Optical Data Science II, 1093704 (1 March 2019); doi: 10.1117/12.2508451
Show Author Affiliations
M. Caselle, Karlsruhe Institute of Technology (Germany)
Lorenzo Rota, Karlsruhe Institute of Technology (Germany)
SLAC National Accelerator Lab. (United States)
A. Kopmann, Karlsruhe Institute of Technology (Germany)
S. A. Chilingaryan, Karlsruhe Institute of Technology (Germany)
M. Mahaveer Patil, Karlsruhe Institute of Technology (Germany)
W. Wang, Karlsruhe Institute of Technology (Germany)
E. Bründermann, Karlsruhe Institute of Technology (Germany)
S. Funkner, Karlsruhe Institute of Technology (Germany)
M. Nasse , Karlsruhe Institute of Technology (Germany)
G. Niehues, Karlsruhe Institute of Technology (Germany)
M. Norbert Balzer, Karlsruhe Institute of Technology (Germany)
M. Weber, Karlsruhe Institute of Technology (Germany)
A. S. Müller, Karlsruhe Institute of Technology (Germany)
S. Bielawski, Univ. des Sciences et Technologies de Lille (France)


Published in SPIE Proceedings Vol. 10937:
Optical Data Science II
Bahram Jalali; Ken-ichi Kitayama, Editor(s)

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