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Focusing through scattering medium: a fundamental trade-off between speckle size and intensity enhancement (Conference Presentation)
Author(s): Eitan Edrei; Giuliano Scarcelli
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Paper Abstract

Focusing light through scattering materials by modifying the phase profile of the illuminating beam has attracted a great deal of attention in the past decade paving the way towards novel applications. Here we introduce a tradeoff between two seemingly independent quantities of critical importance in the focusing process: the size of the focal point obtained behind a scattering medium and the maximum achievable brightness of such focal point. We theoretically derive and experimentally demonstrate the fundamental limits of intensity enhancement of the focal point and relate them to the intrinsic properties of the scattering phenomenon. We demonstrate that the intensity enhancement limitation becomes dominant when the focusing plane gets closer to the scattering layer thus limiting the ability to obtain tight focusing at high contrast, which has direct relevance for the many applications exploring scattering materials as a platform for high resolution focusing and imaging

Paper Details

Date Published: 4 March 2019
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Proc. SPIE 10886, Adaptive Optics and Wavefront Control for Biological Systems V, 108860O (4 March 2019); doi: 10.1117/12.2508360
Show Author Affiliations
Eitan Edrei, Univ. of Maryland, College Park (United States)
Giuliano Scarcelli, Univ. of Maryland, College Park (United States)


Published in SPIE Proceedings Vol. 10886:
Adaptive Optics and Wavefront Control for Biological Systems V
Thomas G. Bifano; Sylvain Gigan; Na Ji, Editor(s)

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