Share Email Print
cover

Proceedings Paper

Using IDD to analyze analog faults and development of a sensor
Author(s): Yvan Maidon; Yann Deval; Helene Fremont; Jean Paul Dom
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

The aim of this paper is a general survey of the test methods of analogue and mixed circuits, using a stimulus on the signal or power supply inputs, while the data came from the output current Is or the power supply current IDD. It insists on the fruitful measurement of IDDQ, the dc power supply current, as well as the measurement of IDDT, the transient power supply current. The design of a transducer has been performed. Its function is transparent because its power consumption is low and has no effect on the behavior of the circuit under test. This transducer is fast, accurate, linear and small for its possible duplication in the CUT. It can be inserted in mixed signal ASICs. Its performance in linearity and time domain allows us to exploit the advantages of the IDD testing methods. This work is not a new approach of the fault detection but shows the application of new means for the static and dynamic measurements of IDD.

Paper Details

Date Published: 12 September 1996
PDF: 10 pages
Proc. SPIE 2874, Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II, (12 September 1996); doi: 10.1117/12.250823
Show Author Affiliations
Yvan Maidon, Univ. de Bordeaux I (France)
Yann Deval, Univ. de Bordeaux I (France)
Helene Fremont, Univ. de Bordeaux I (France)
Jean Paul Dom, Univ. de Bordeaux I (France)


Published in SPIE Proceedings Vol. 2874:
Microelectronic Manufacturing Yield, Reliability, and Failure Analysis II
Ali Keshavarzi; Sharad Prasad; Hans-Dieter Hartmann, Editor(s)

© SPIE. Terms of Use
Back to Top