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Zinc-oxide nanowires characterization using optical reflectance
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Paper Abstract

In this work, we propose a simple and time-saving method for the characterization of the ZnO-NWs. The method is based on the measurement of the spectral reflection of the ZnO-NWs in the UV-VIS-NIR ranges. Then the ZnO-NWs effective refractive index, and subsequently the density, and the length are obtained making use of the interference pattern contrast and periodicity in the reflection response versus wavelength. The extracted NWs length and density using the proposed method show good agreement with the SEM results. This characterization method opens the door for easy and cheap monitoring of the growth within microfluidic environment.

Paper Details

Date Published: 1 March 2019
PDF: 6 pages
Proc. SPIE 10919, Oxide-based Materials and Devices X, 1091922 (1 March 2019); doi: 10.1117/12.2507935
Show Author Affiliations
Mazen Erfan, Univ. Paris-Est, ESYCOM, CNRS, ESIEE Paris (France)
Univ. Paris-Est, ESYCOM, CNRS, UPEM (France)
Martine Gnambodoe-Capochichi, Univ. Paris-Est, ESYCOM, CNRS, UPEM (France)
Marie Le Pivert, Univ. Paris-Est, ESYCOM, CNRS, UPEM (France)
Frédéric Marty, Univ. Paris-Est, ESYCOM, CNRS, ESIEE Paris (France)
Yasser M. Sabry, Ain Shams Univ. (Egypt)
Yamin Leprince-Wang, Univ. Paris-Est, ESYCOM, CNRS, UPEM (France)
Tarik Bourouina, Univ. Paris-Est, ESYCOM, CNRS, ESIEE Paris (France)


Published in SPIE Proceedings Vol. 10919:
Oxide-based Materials and Devices X
David J. Rogers; David C. Look; Ferechteh H. Teherani, Editor(s)

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