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Proceedings Paper

Versatile scanning near-field optical microscope using an apertureless metallic probe
Author(s): R. Bachelot; Ahmed Lahrech; Philippe Gleyzes; Albert Claude Boccara
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Paper Abstract

Theoretically, it is well known that the classical optical microscope resolution, is limited to about 250 nm. Actually, the scanning near-field optical microscopy allow to get over this limit. Using a vibrating opaque metallic tip, which periodically and locally perturbs the electromagnetic field distribution of a focused laser spot in to the sample surface, we have observed with better resolution than the theoretical limit many topographic and optical test object.

Paper Details

Date Published: 18 September 1996
PDF: 12 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250787
Show Author Affiliations
R. Bachelot, ESPCI (France)
Ahmed Lahrech, ESPCI (France)
Philippe Gleyzes, ESPCI (France)
Albert Claude Boccara, ESPCI (France)


Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)

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