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Proceedings Paper

Holographic data acquisition and display in real and quasi-real time: friendly for industrial inspections
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Paper Abstract

Quick, reliable and inexpensive testing of products and components is needed in industry more often than not. Holography due to its intrinsic limitations and reasonably high costs yet is a method which is used comparatively rarely for industrial optical inspections. In the Laboratory of Technical Optics, Laser Technologies and Optoelectronics we produce holograms and interferograms on silver halide media in extremely unpromising conditions intentionally introduced to fit industrial ones. The main features of our processes are: (1) high speed of the whole process of data acquisition, storage and final presentation; (2) possibility to perform all these operations in strong daylight corresponding to industrial illumination levels or even exceeding recommended levels of illumination of industrial working places; (3) possibility to avoid any dark rooms; (4) high diffraction efficiency of holograms measured at the wavelength of recording, i.e. any wavelength shifts of holographic reconstruction are avoided for any types of holograms including reflection ones usually suffering from such shifts; (5) low costs due to low labor and equipment costs; and (6) easiness of performing quick checks in industrial environment. In our experiments we investigated various optical setups for recording holograms, double exposure and real time interferograms, in situ among them, and different types of holographic optical elements. We used different types of lasers: helium-neon (633 nm), argon (488 nm), semiconductor (675 and 685 nm), ruby (693 nm). Various silver halide media were used: Agfa Gevaert 8 E 75 HD films and plates, Russian PFG-03 and PFG-03 C (color).

Paper Details

Date Published: 18 September 1996
PDF: 5 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250759
Show Author Affiliations
Valery Petrov, Independent Researcher (Germany)
Bernhard Lau, Fachhochschule Ulm (Germany)


Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements
Christophe Gorecki, Editor(s)

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