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Proceedings Paper

Holographic illumination for comparison in interferometry
Author(s): Zoltan Fuezessy; Ferenc Gyimesi; Bela Raczkevi; Janos P. Makai; Janos Kornis; Ildiko Laszlo
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Paper Abstract

Conventional holographic interferometric and speckle pattern interferometric techniques are tailored basically to compare the two states of the very same object, which may have optically rough surface or optically distorting transparent walls around. The direct comparison of the behavior of two different--but macroscopically quite similar--objects does not fit naturally in the process. At present, this type of extension can go three different ways. In holographic interferometry, one can mix the interferograms of the two objects at some sublevel of interferogram making and the moire effect of the individual fringe systems can be produced. In speckle pattern interferometry, the reference surface can be replaced by the other object itself and it serves as a live reference: changing according to the test object. Finally, although really first if time of birth is regarded, holographically recorded and reconstructed images of a master object can be used for illumination of test objects--in an otherwise conventional holographic or speckle interferometric arrangement. The present paper deals with this latter technique. Some new developments are reported in difference holographic interferometry and partly as a consequence of this--a really successful realization is introduced in holographically illuminated difference ESPI.

Paper Details

Date Published: 18 September 1996
PDF: 6 pages
Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250756
Show Author Affiliations
Zoltan Fuezessy, Technical Univ. Budapest (Hungary)
Ferenc Gyimesi, Technical Univ. Budapest (Hungary)
Bela Raczkevi, Technical Univ. Budapest (Hungary)
Janos P. Makai, Technical Univ. Budapest (Hungary)
Janos Kornis, Technical Univ. Budapest (Hungary)
Ildiko Laszlo, Technical Univ. Budapest (Hungary)


Published in SPIE Proceedings Vol. 2782:
Optical Inspection and Micromeasurements

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