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Rapid and adjustable shifted excitation Raman difference spectroscopy at 785 nm
Author(s): M. Maiwald; B. Sumpf
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Paper Abstract

Rapid and adjustable shifted excitation Raman difference spectroscopy at 785 nm is presented. Here, a dual-wavelength diode laser is used for the excitation. This monolithic device contains two laser resonators and two distributed Bragg reflector (DBR) gratings which provide the two excitation lines for SERDS. The diode laser shows an optical power of 170 mW for each emission line. A flexible spectral distance up to 36 cm-1 is realized using two separate heater elements which are implemented close to the DBR gratings. An alternating operation with modulation frequencies up to 100 Hz is performed without changing the spectral properties including a narrow linewidth of 11 pm. Raman experiments are carried out for validation. Here, Irish Cream is used as the test sample. Raman and SERDS spectra at the selected spectral distance at 15 cm-1 are presented and discussed as an example. Rapid SERDS is demonstrated with an alternating operation and integration times of 50 ms for a single Raman spectrum. A discrimination of closely neighboured Raman bands of different components of Irish Cream and a 15-fold improvement of the signal-tobackground noise in the reconstructed SERDS spectrum is achieved. The results demonstrate rapid and adjustable SERDS using a dual-wavelength diode laser as a potential tool for Raman applications such as real-time measurements which require quick on-site decisions and experiments under strong and varying background interferences, e.g., from laser induced fluorescence and ambient light.

Paper Details

Date Published: 7 March 2019
PDF: 9 pages
Proc. SPIE 10894, Plasmonics in Biology and Medicine XVI, 108940W (7 March 2019); doi: 10.1117/12.2507409
Show Author Affiliations
M. Maiwald, Ferdinand-Braun-Institut (Germany)
B. Sumpf, Ferdinand-Braun-Institut (Germany)

Published in SPIE Proceedings Vol. 10894:
Plasmonics in Biology and Medicine XVI
Tuan Vo-Dinh; Ho-Pui A. Ho; Krishanu Ray, Editor(s)

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