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Proceedings Paper

Moisture influence on near-infrared prediction of wheat hardness
Author(s): William R. Windham; Charles S. Gaines; Richard G. Leffler
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Paper Abstract

Recently near infrared (NTR) reflectance instrumentation has been used to provide an empirical measure of wheat hardness. This hardness scale is based on the radiation scattering properties of meal particles at 1680 and 2230 nm. Hard wheats have a larger mean particles size (PS) after grinding than soft wheats. However wheat kernel moisture content can influence mean PS after grinding. The objective of this study was to determine the sensitivity of MR wheat hardness measurements to moisture content and to make the hardness score independent of moisture by correcting hardness measurements for the actual moisture content of measured samples. Forty wheat cultivars composed of hard red winter hard red spring soft red winter and soft white winter were used. Wheat kernel subsamples were stored at 20 40 60 and 80 relative humidity (RH). After equilibration samples were ground and the meal analyzed for hardness score (HS) and moisture. HS were 48 50 54 and 65 for 20 40 60 and 80 RH respectively. Differences in HS within each wheat class were the result of a moisture induced change in the PS of the meal. An algorithm was developed to correct HS to 11 moisture. This correction provides HS that are nearly independent of moisture content. 1.

Paper Details

Date Published: 1 February 1991
PDF: 6 pages
Proc. SPIE 1379, Optics in Agriculture, (1 February 1991); doi: 10.1117/12.25073
Show Author Affiliations
William R. Windham, U.S. Dept. of Agriculture (United States)
Charles S. Gaines, U.S. Dept. of Agriculture (United States)
Richard G. Leffler, U.S. Dept. of Agriculture (United States)


Published in SPIE Proceedings Vol. 1379:
Optics in Agriculture
James A. DeShazer; George E. Meyer, Editor(s)

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