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Magnetic-field measurements with amplitude-modulated light and intensity correlation technique (Conference Presentation)
Author(s): Gour S. Pati; Kevin Heesh; Bruce Barrios; Renu Tripathi; Anthony W. Yu; Michael A. Krainak
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Paper Abstract

Resonant excitation of an atomic medium with amplitude modulated (AM) light can produce synchronous optical pumping effects. Nonlinear magneto-optical rotation (NMOR) is produced with AM light when the optical pumping rate is synchronous with the Larmor frequency. Traditionally, magnetic field measurements have been performed using lock-in detection of the NMOR signal with the transmitted light. Instead of NMOR, we have studied intensity correlation between two orthogonally polarized components of the AM light passing through a rubidium vapor cell, for magnetic field measurements. We have used a pure 87Rb cell (1 cm in diameter and 2 cm in length) filled with Ne buffer gas for this study. Intensity correlation is performed by recording the intensity data from two fast photodetectors with a high bandwidth digitizer board. We have measured the dependence of the zero-delay intensity correlation on the magnetic field. We have also studied the dependence of the correlation width on the light intensity and cell temperature. Results obtained from the theoretical model are also compared with the experiment. The results suggest intensity correlation can be used as a viable technique for improving the performance of magnetic field measurements with AM light.

Paper Details

Date Published: 4 March 2019
Proc. SPIE 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology, 1093404 (4 March 2019); doi: 10.1117/12.2507057
Show Author Affiliations
Gour S. Pati, Delaware State Univ. (United States)
Kevin Heesh, Delaware State Univ. (United States)
Bruce Barrios, Delaware State Univ. (United States)
Renu Tripathi, Delaware State Univ. (United States)
Anthony W. Yu, NASA Goddard Space Flight Ctr. (United States)
Michael A. Krainak, NASA Goddard Space Flight Ctr. (United States)

Published in SPIE Proceedings Vol. 10934:
Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
Selim M. Shahriar; Jacob Scheuer, Editor(s)

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