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Proceedings Paper • Open Access • new

Reconstruction of the free-falling body trajectory in an optical interferometric absolute gravimeter (Retraction Notice)
Author(s): Bin Pang; Jiapeng Mou; Jianhua Yang; Tengchao Huang; Chengge Wang; Xiaowu Shu

Paper Abstract

Publisher’s Note: This paper, originally published on 18 January 2019, was retracted from the SPIE Digital Library on 24 April 2019 upon verification that an incomplete draft of the paper was submitted and published in which text and figures were omitted, and figures were adapted or copied from the following publications without attribution:

Figure 1: Christian Rothleitner, “Ultra-high Precision, Absolute, Earth Gravity Measurements,” Dissertation, Universitat Erlangen-Nuremberg, Fig. 2.3, page 28 (June 2008).

Figure 4: S Svitlov, P Masłyk, Ch Rothleitner, H Hu, and L J Wang, “Comparison of three digital fringe signal processing methods in a ballistic free-fall absolute gravimeter,” Metrologia, Volume 47, Number 6 (2010); https://doi.org/10.1088/0026-1394/47/6/007

Figures 7 and 8: S Svitlov, Ch Rothleitner, and L J Wang, “Accuracy assessment of the two-sample zero-crossing detection in a sinusoidal signal,” Metrologia, Volume 49, Number 4 (2012); https://doi.org/10.1088/0026-1394/49/4/413

The authors regret their oversight.

Paper Details

Date Published: 18 January 2019
PDF: 1 pages
Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108391P (18 January 2019); doi: 10.1117/12.2506838
Show Author Affiliations
Bin Pang, Zhejiang Univ. (China)
Jiapeng Mou, Zhejiang Univ. (China)
Jianhua Yang, Zhejiang Univ. (China)
Tengchao Huang, Zhejiang Univ. (China)
Chengge Wang, Zhejiang Univ. (China)
Xiaowu Shu, Zhejiang Univ. (China)


Published in SPIE Proceedings Vol. 10839:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Fan Wu; Yudong Zhang; Xiaoliang Ma; Xiong Li; Bin Fan, Editor(s)

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