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Study on image stitching algorithm of surface defects three-dimensional features measurement with transient interferometry
Author(s): Baoming Huang; Yingjie Yu; Kaizao Ni; Shijie Liu; You Zhou; Jianda Shao
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Paper Abstract

Surface defects on large-aperture optical elements are one of the key factors to restrain the improvement of performance of high-power laser systems. Detecting and characterizing accurately these defects are an important basis for optical elements manufacturing and system performance evaluation. Based on the principle of transient interferometry, a measurement setup used to detect the three-dimensional features of surface defects is reported in this paper. We also propose a template matching and stitching algorithm for interferometric images obtained by the system: Firstly, determining whether the interference images have enough features to complete the stitching work; secondly, selecting the stitching template in the area where the template image needed to be stitched; Finally, searching for the template in the stitched image, and calculating the relative offset of these two images according to the relative position of the template to complete the stitching work. Through simulation analysis and actual image obtained by the measurement system verification, the proposed algorithm has the advantages of good noise resistance and high mosaic accuracy. Moreover, it has a positive significance for the study of transient interferometry detection.

Paper Details

Date Published: 18 January 2019
PDF: 9 pages
Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 1083916 (18 January 2019); doi: 10.1117/12.2506239
Show Author Affiliations
Baoming Huang, Shanghai Univ. (China)
Shanghai Institute of Optics and Fine Mechanics (China)
Yingjie Yu, Shanghai Univ. (China)
Kaizao Ni, Shanghai Institute of Optics and Fine Mechanics (China)
Shijie Liu, Shanghai Institute of Optics and Fine Mechanics (China)
You Zhou, Shanghai Institute of Optics and Fine Mechanics (China)
Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10839:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Fan Wu; Yudong Zhang; Xiaoliang Ma; Xiong Li; Bin Fan, Editor(s)

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