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Proceedings Paper

Quantitative analysis of imaging quality of the segmented planar imaging detector
Author(s): Weiping Gao; Xiaorui Wang; Lin Ma; Danfeng Guo
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Paper Abstract

The segmented planar imaging method is a new imaging concept based on Van Cittert-Zernike theory that offers significantly reduced size, weight, and power consumption compared to a traditional imaging system and aims to realize high resolution imaging. In this paper, the segmented planar imaging detector (SPID) imaging process has been accurately modeled and quantitatively analyzed to image quality enhancement. The influences of the longest interferometer baseline and the spectral channel number of array wave-guide grating(AWG) on the imaging quality of the SPID have been analyzed. It is verified that the cut off spatial frequency and the resolution of the SPID system is determined by the longest interferometer baseline Bmax. The imaging process of different Bmax have been numerical simulated to evaluate the impact of longest interferometer baseline on the SPID system, and the reconstruction image shows that the imaging quality can be improved by increasing the longest interferometer baseline. Also, the numerical simulations of different number of spectral channels of AWG have been operated, and the results showed that the visibility of interference fringes and spatial frequency coverage points are increased with the increasing number of spectral channels. Therefore, the imaging quality improved with the increasing number of spectral channel of AWG. In conclusions, the research results will provide theoretical and technical supports for segmented planar integral optical imaging system development.

Paper Details

Date Published: 15 November 2018
PDF: 9 pages
Proc. SPIE 10964, Tenth International Conference on Information Optics and Photonics, 1096433 (15 November 2018); doi: 10.1117/12.2505876
Show Author Affiliations
Weiping Gao, Xidian Univ. (China)
Xiaorui Wang, Xidian Univ. (China)
Lin Ma, Xidian Univ. (China)
Danfeng Guo, Xidian Univ. (China)

Published in SPIE Proceedings Vol. 10964:
Tenth International Conference on Information Optics and Photonics
Yidong Huang, Editor(s)

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