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Proceedings Paper

Negative differential capacitance in InGaAs/InAlAs photodetector
Author(s): Junxi Zhang; Jun Chen
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Paper Abstract

Negative differential capacitance (NDC) has been observed in InGaAs/InAlAs p-i-n photodetector. The frequency dependence of the NDC is observed at the frequency of 50~300kHz. A model involving two states is built to explain the observed NDC behavior. Low dark current is obtained at room temperature with the 1550nm wavelength infrared light.

Paper Details

Date Published: 12 December 2018
PDF: 5 pages
Proc. SPIE 10846, Optical Sensing and Imaging Technologies and Applications, 1084627 (12 December 2018); doi: 10.1117/12.2505396
Show Author Affiliations
Junxi Zhang, Soochow Univ. (China)
Jun Chen, Soochow Univ. (China)

Published in SPIE Proceedings Vol. 10846:
Optical Sensing and Imaging Technologies and Applications
Mircea Guina; Haimei Gong; Jin Lu; Dong Liu, Editor(s)

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