Share Email Print
cover

Proceedings Paper • new

Research on the graphene oxide's dielectric constant at the microwave frequency of 9.231GHz
Author(s): Keqin Zhao; Xiu Li; Yunting Chu; Tianyi Jiao; Changmin Yu; Chuang Wu; Guiying Yu; Xiuyan Chen
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The dielectric constants of graphene oxide’s at 9.231GHz have been studied by cavity perturbation methods. 5g/ml and 2.5g/ml two different concentration graphene oxides were prepared and instilled into glass capillaries with the diameter of 0.9mm and 0.5mm. Based on the Independently developed heating system and temperature display device, the dielectric constants with different depth of microwave cavity were measured at different temperature from 18° to 38°. It found that the graphene oxide’s dielectric constants became lager when the depth increased in the cavity. In addition, it varied obviously when the diameters of the sample changed.

Paper Details

Date Published: 12 December 2018
PDF: 6 pages
Proc. SPIE 10848, Micro-Optics and MOEMS, 108480A (12 December 2018); doi: 10.1117/12.2505322
Show Author Affiliations
Keqin Zhao, Shenyang Normal Univ. (China)
Xiu Li, Beijing Institute of Graphic Communication (China)
Yunting Chu, Shenyang Normal Univ. (China)
Tianyi Jiao, Shenyang Normal Univ. (China)
Changmin Yu, Shenyang Normal Univ. (China)
Chuang Wu, Shenyang Normal Univ. (China)
Guiying Yu, Shenyang Normal Univ. (China)
Xiuyan Chen, Shenyang Normal Univ. (China)


Published in SPIE Proceedings Vol. 10848:
Micro-Optics and MOEMS
Yuelin Wang; Huikai Xie, Editor(s)

© SPIE. Terms of Use
Back to Top