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Research on the UV energy measurement based on UV LEDs
Author(s): Fangsheng Lin; Tiecheng Li; Dejin Yin; Muyao Ji; Leibing Shi; Lei Lai
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Paper Abstract

With the development of LED technology research, more and more UV LED light sources have been used in UV curable coatings industry, instead of traditional UV lamps. Compared with the traditional UV fluorescent lamps, UV LEDs have many advantages, such as single peak, more energy saving, longer life, less thermal diffusivity. In the process of actual application, we need to monitor the intensity and energy of UV LED light sources regularly; therefore it is very important to make sure that the ultraviolet energy meter we adopted is accurate. In this paper, we firstly introduce our UV energy meter calibration device. We obtain the relative spectral distribution of UV LEDs and traditional curing UV light sources through spectrometer. By the analysis of spectral differences between the two, combined with the standard ultraviolet energy meter spectral response curve, we improve the measurement method to adapt to UV LED energy meters calibration. In this paper, the attention in the relevant calibration method is put forward for the characteristics of UV LEDs and the corresponding measurement uncertainty analysis is also evaluated to provide guidance for daily calibration.

Paper Details

Date Published: 18 January 2019
PDF: 5 pages
Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108390W (18 January 2019); doi: 10.1117/12.2505138
Show Author Affiliations
Fangsheng Lin, Shanghai Institute of Measurement and Testing Technology (China)
Tiecheng Li, Shanghai Institute of Measurement and Testing Technology (China)
Dejin Yin, Shanghai Institute of Measurement and Testing Technology (China)
Muyao Ji, Shanghai Institute of Measurement and Testing Technology (China)
Leibing Shi, Shanghai Institute of Measurement and Testing Technology (China)
Lei Lai, Shanghai Institute of Measurement and Testing Technology (China)


Published in SPIE Proceedings Vol. 10839:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Fan Wu; Yudong Zhang; Xiaoliang Ma; Xiong Li; Bin Fan, Editor(s)

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