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Design and Instrumentation of transmission digital holographic microscopy
Author(s): Bingcai Liu; Ailing Tian; Hongjun Wang; Xueliang Zhu; Siwei Zhao; Danqing Feng
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Paper Abstract

Digital holographic microscopy is a new real-time 3D measurement technique, which is designed and installed by optical holography, microscopic imaging and optical information processing. Compared with the traditional optical holography, CCD camera is used instead of the conventional silver to record holograms, and it is reconstructed by digital reference wave-front. Firstly, based on optical holographic principle, the optical system of digital holographic microscopy is designed. And then, the technical parameter of the key optical elements is analyzed, and its whole mechanical fixed structure is designed using SOLIDWORKS software. Lastly, the experiment device is installed, and the steady holograms are obtained by CCD camera. Based on the reliable digital holograms, the digital reconstructed software is developed by Visual C++ 2010. And the corresponding programming modules are debugged, for example FFT computing module, angular spectrum method module, 3D surface display module, and so on. Finally, micro-lens array is used as contrast experiment sample under-test, the perfect phase data can be obtained through the developed hardware and software of digital holographic microscopy, and also, well intensity image of sinusoidal grating, scratch, cicada moth and onion epidermal is acquired in the trial experiments.

Paper Details

Date Published: 18 January 2019
PDF: 7 pages
Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108390S (18 January 2019); doi: 10.1117/12.2505045
Show Author Affiliations
Bingcai Liu, Xi'an Technological Univ. (China)
Ailing Tian, Xi'an Technological Univ. (China)
Hongjun Wang, Xi'an Technological Univ. (China)
Xueliang Zhu, Xi'an Technological Univ. (China)
Siwei Zhao, Xi'an Technological Univ. (China)
Danqing Feng, Xi'an Technological Univ. (China)


Published in SPIE Proceedings Vol. 10839:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Fan Wu; Yudong Zhang; Xiaoliang Ma; Xiong Li; Bin Fan, Editor(s)

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