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Application of variational mode decomposition method in Fourier transform profilometry
Author(s): Kangzhi Qin; Yu Zhang; Jinlong Li
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Paper Abstract

For the spectrum overlapping problem caused by the fundamental frequency component and the zero-frequency component in the Fourier Transform Profilometry (FTP), a new method based on Two-Dimensional Variational Mode Decomposition (2DVMD) is proposed to extract the fundamental frequency components, and it can adaptively decompose the fringe pattern into background part and fringe part. Comparing 2DVMD method and Bidmensional Empirical Mode Decomposition (BEMD) method in zero-frequency components removing, it is found that 2DVMD method can perfectly separate the fundamental frequency component from the zero-frequency component and can extract the fundamental frequency information completely, thus avoiding the loss of the fundamental frequency information caused by filtering. Then the inverse Fourier transform and the phase unwrapping algorithm are performed to the extracted fundamental frequency component, it can effectively recover the abrupt change information of the measured object. Numerical simulations and experimental results show that the FTP based on 2DVMD method can reconstruct the details of the measured object more effectively than the FTP based on filtering method.

Paper Details

Date Published: 18 January 2019
PDF: 10 pages
Proc. SPIE 10839, 9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment, 108390L (18 January 2019); doi: 10.1117/12.2504936
Show Author Affiliations
Kangzhi Qin, Southwest Jiaotong Univ. (China)
Yu Zhang, Southwest Jiaotong Univ. (China)
Jinlong Li, Southwest Jiaotong Univ. (China)


Published in SPIE Proceedings Vol. 10839:
9th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test, Measurement Technology, and Equipment
Fan Wu; Yudong Zhang; Xiaoliang Ma; Xiong Li; Bin Fan, Editor(s)

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