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Aliasing artefact index for image interpolation quality assessment
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Paper Abstract

A preliminary study of a non-reference aliasing artefact index (AAI) metric is presented in this paper. We focus on the effects of combining a full-reference metric and interpolation algorithm. The nearest neighbor algorithm (NN) is used as the gold standard against which test-algorithms are judged in terms of aliased structures. The structural similarity index (SSIM) metric is used to evaluate a test image (i.e. a test-algorithm’s image) and a reference image (i.e. the NN’s image). Preliminary experiments demonstrated promising effects of the AAI metric against state-of-the-art non-reference metrics mentioned. A new study may further develop the studied metric for potential applications in image quality adaptation and/or monitoring in medical imaging.

Paper Details

Date Published: 7 November 2018
PDF: 9 pages
Proc. SPIE 10817, Optoelectronic Imaging and Multimedia Technology V, 108171E (7 November 2018); doi: 10.1117/12.2503872
Show Author Affiliations
Olivier Rukundo, Aalborg Univ. (Denmark)
Samuel E. Schmidt, Aalborg Univ. (Denmark)


Published in SPIE Proceedings Vol. 10817:
Optoelectronic Imaging and Multimedia Technology V
Qionghai Dai; Tsutomu Shimura, Editor(s)

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