Share Email Print

Proceedings Paper

The method of determining the characteristic features of graphene oxides by atomic force microscopy
Author(s): S. Drewniak; R. Muzyka
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

In this paper, we present the results of the measurements obtained using atomic force microscopy (AFM). The subject of research were the reduced graphene oxides which were obtained by oxidation (in first step) of the graphites and thermally reduction (in the second step). The three types of graphites (flake, scale and synthetic) and three different method of oxidation were used in the measurements. The special attention was paid to the height and horizontal sizes of the obtained material. The results was analysed and relevant conclusions were drawn from them.

Paper Details

Date Published: 14 August 2018
PDF: 7 pages
Proc. SPIE 10830, 13th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 1083011 (14 August 2018); doi: 10.1117/12.2503825
Show Author Affiliations
S. Drewniak, Silesian Univ. of Technology (Poland)
R. Muzyka, Institute for Chemical Processing of Coal (Poland)

Published in SPIE Proceedings Vol. 10830:
13th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods
Przemyslaw Struk; Tadeusz Pustelny, Editor(s)

© SPIE. Terms of Use
Back to Top