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Proceedings Paper

Structural and optical characterization of the high quality Be-doped InAs epitaxial layer grown on GaAs substrate
Author(s): Jarosław Wróbel; Kacper Grodecki; Djalal Benyahia; Krzysztof Murawski; Krystian Michalczewski; Justyna Grzonka; Jacek Boguski; Kinga Gorczyca; Gilberto A. Umana-Membreno; Łukasz Kubiszyn; Artur Kębłowski; Paweł Piotr Michałowski; Emilia Gomółka; Piotr Martyniuk; Józef Piotrowski; Antoni Rogalski
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Paper Abstract

The highly Be-doped InAs layer has been grown on semi-insulating GaAs (100) substrate by Molecular Beam Epitaxy. Very good quality of the layer has been attested by high resolution scanning electron microscope (HR-SEM), X-ray diffraction (XRD) and the Raman spectra. The parallel and perpendicular residual strain are determined to be – 1.17 × 10-3 , and 1.12 × 10-3 , respectively. Moreover, the absorbance (ABS) and photoluminescence (PL) spectra were collected in order to estimate the bandgap narrowing. The 10 meV bandgap shrinking for 1.7×1018 cm-3 acceptor concentration suggests necessity of reexamining the Jain et al model [Jain, S. C., et al. - JAP 68(7): 3747-3749] in the context of actual values of InAs valence-bands effective-masses.

Paper Details

Date Published: 14 August 2018
PDF: 6 pages
Proc. SPIE 10830, 13th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, 108300S (14 August 2018); doi: 10.1117/12.2503624
Show Author Affiliations
Jarosław Wróbel, Military Univ. of Technology (Poland)
Kacper Grodecki, Military Univ. of Technology (Poland)
Djalal Benyahia, Military Univ. of Technology (Poland)
Krzysztof Murawski, Military Univ. of Technology (Poland)
Krystian Michalczewski, Military Univ. of Technology (Poland)
Justyna Grzonka, Institute of Electronic Materials Technology (Poland)
Jacek Boguski, Military Univ. of Technology (Poland)
Kinga Gorczyca, Military Univ. of Technology (Poland)
Gilberto A. Umana-Membreno, The Univ. of Western Australia (Australia)
Łukasz Kubiszyn, VIGO System S.A. (Poland)
Artur Kębłowski, VIGO System S.A. (Poland)
Paweł Piotr Michałowski, Institute of Electronic Materials Technology (Poland)
Emilia Gomółka, Military Univ. of Technology (Poland)
Piotr Martyniuk, Military Univ. of Technology (Poland)
Józef Piotrowski, VIGO System S.A. (Poland)
Antoni Rogalski, Military Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 10830:
13th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods
Przemyslaw Struk; Tadeusz Pustelny, Editor(s)

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