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Efficient computation of the Strehl ratio for the wavefront coding system with the rotationally symmetric phase mask
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Paper Abstract

The Strehl ratio (SR) describes the ratio of the on-axis intensity between the aberrated system and the diffraction limited system. It can be used to build the merit function for the optimization of phase mask in the wavefront coding system. We propose a computationally efficient method for the SR and use it to compute the SR with different defocus errors for the wavefront coding system using the rotationally symmetric phase mask. With this method, the computation efficiency of the merit function can be improved greatly in the optimization of the rotationally symmetric phase mask.

Paper Details

Date Published: 9 August 2018
PDF: 6 pages
Proc. SPIE 10806, Tenth International Conference on Digital Image Processing (ICDIP 2018), 108066J (9 August 2018); doi: 10.1117/12.2503086
Show Author Affiliations
Xinhua Chen, Soochow Univ. (China)
Xiaofeng Wang, Soochow Univ. (China)
Weimin Shen, Soochow Univ. (China)


Published in SPIE Proceedings Vol. 10806:
Tenth International Conference on Digital Image Processing (ICDIP 2018)
Xudong Jiang; Jenq-Neng Hwang, Editor(s)

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