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Surface plasmon-assisted transmission in dual metallic film
Author(s): Xiumin Xie; Weiying Hu; Qiang Xu; Shuai Huang; Jian Chen; Qian Dai; Zhu Shi; Libo Yu; Zhiming M. Wang; Qiang Zhou; Hai-Zhi Song
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Paper Abstract

Transmission properties of transverse magnetic light through periodic sub-wavelength slit apertures on a metallic film, behind which is another planar metallic film, are studied by finite-difference-time-domain method with constant periodicity and slit width. The result shows that the transmitted energy is strongly correlated to both the thickness of the metallic grating and the distance between such two films at a specific wavelength. The thickness of the grating acts as a filter that allows specific wavelengths to go through the slits, while the distance of dual metallic film dominantly determines a constructive or destructive interference between the transmitted light through the slits and the reflected wave from the back film. Besides, a strong vibration in the transmission spectrum as a function of the grating thickness is interestingly observed, which can be interpreted by the resonance of the surface plasmons of the front and the back metallic films.

Paper Details

Date Published: 5 November 2018
PDF: 8 pages
Proc. SPIE 10815, Optical Design and Testing VIII, 1081507 (5 November 2018); doi: 10.1117/12.2502768
Show Author Affiliations
Xiumin Xie, Southwest Institute of Technical Physics (China)
Weiying Hu, Southwest Institute of Technical Physics (China)
Qiang Xu, Southwest Institute of Technical Physics (China)
Shuai Huang, Southwest Institute of Technical Physics (China)
Jian Chen, Southwest Institute of Technical Physics (China)
Qian Dai, Southwest Institute of Technical Physics (China)
Zhu Shi, Southwest Institute of Technical Physics (China)
Libo Yu, Southwest Institute of Technical Physics (China)
Zhiming M. Wang, Univ. of Electronic Science and Technology of China (China)
Qiang Zhou, Univ. of Electronic Science and Technology of China (China)
Hai-Zhi Song, Southwest Institute of Technical Physics (China)
Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 10815:
Optical Design and Testing VIII
Yongtian Wang; Tina E. Kidger; Kimio Tatsuno, Editor(s)

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