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Proceedings Paper

Comparative analysis of mid-spatial frequency errors measurement using multiple phase retrieval algorithms
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Paper Abstract

In inertial confinement fusion high energy system, the mid-spatial frequency (MSF) errors of optical elements induced by computer numerical control tools lead to damage to the optical system. Based on the characteristics of the mid-spatial frequency errors, it is measured by using phase retrieval technology. Compared with conventional measurement methods such as interferometry, MSF errors can be measured by phase retrieval without complex measurement systems and large aperture optical elements with MSF errors can be measured via phase retrieval in theory. In this paper, we compare multiple phase retrieval algorithms that are used to measure optical element with MSF errors and explore approaches to improve the quality of results. First, we briefly introduce the feature of MSF errors and the relation between the wavefront of optical element with MSF errors and its diffraction pattern. Second, multiple phase retrieval algorithms including error-reduction (ER) algorithm, hybrid input-output (HIO) algorithm and oversampling smoothness (OSS) algorithm are adapted for the measurement of MSF errors. According to the bandwidth and structure characteristics of MSF errors, the convergence speed and the accuracy of above algorithms are discussed and compared. Then, according to the characteristics of different algorithms, different retrieved wavefront phase via using these algorithms are integrated to improve the accuracy of results. Last, based on the feature of MSF errors, the priori knowledge of algorithms is also discussed to further gear up the convergence speed and the accuracy of algorithms.

Paper Details

Date Published: 5 November 2018
PDF: 6 pages
Proc. SPIE 10815, Optical Design and Testing VIII, 108151M (5 November 2018); doi: 10.1117/12.2502680
Show Author Affiliations
Lei Zhao, Zhejiang Univ. (China)
Xiao Huang, Zhejiang Univ. (China)
Jian Bai, Zhejiang Univ. (China)
Xiangdong Zhou, Zhejiang Univ. (China)
Yupeng Luo, Zhejiang Univ. (China)
Juan Du, Zhejiang Univ. (China)
Yujie Luo, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 10815:
Optical Design and Testing VIII
Yongtian Wang; Tina E. Kidger; Kimio Tatsuno, Editor(s)

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