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Proceedings Paper

An all-reflective transient-grating based self-referenced spectral interferometry device for few-cycle laser pulses characterization
Author(s): Zhe Si; Jingxin Zhu; Lei Lin; Xiong Shen; Lihua Bai; Jun Liu
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Paper Abstract

An all-reflective transient-grating based self-referenced spectral interferometry (TG-SRSI) device is proposed. Except for a thin transparent Kerr medium used for self-referenced pulse generation, no transmitted material used in the device, which enables few-cycle pulses characterization with center wavelength from ultraviolet to near infrared. An 800 nm/8.1 fs and an 1800 nm/14.3fs pulse are characterized successfully using this device which proves its ability

Paper Details

Date Published: 5 November 2018
PDF: 6 pages
Proc. SPIE 10811, High-Power Lasers and Applications IX, 1081119 (5 November 2018); doi: 10.1117/12.2502612
Show Author Affiliations
Zhe Si, Shanghai Univ. (China)
Shanghai Institute of Optics and Fine Mechanics (China)
Jingxin Zhu, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Lei Lin, Shanghai Institute of Optics and Fine Mechanics (China)
Univ. of Chinese Academy of Sciences (China)
Xiong Shen, Shanghai Institute of Optics and Fine Mechanics (China)
Lihua Bai, Shanghai Univ. (China)
Jun Liu, Shanghai Institute of Optics and Fine Mechanics (China)


Published in SPIE Proceedings Vol. 10811:
High-Power Lasers and Applications IX
Ruxin Li; Upendra N. Singh, Editor(s)

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