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Proceedings Paper

Supercurrent distribution and flux penetration in high-Tc edge Josephson junctions
Author(s): Mark Lee; Steven C. Gausepohl; Kookrin Char
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Paper Abstract

The spatial distribution of supercurrent in high-Tc Josephson junction devices has been studied extensively using field modulation measurements of the critical current and microwave absorption. The devices are edge junctions composed of YBa2Cu3O7-YBa2Co0.21Cu2.79O7-YBa2Cu3O7. The lc(H) patterns allow a quantitative Fourier transform analysis to obtain a self-consistent spatial supercurrent density distribution, Js(x). These junctions are found to be more homogeneous than in most other high-Tc Josephson junctions reported to date.

Paper Details

Date Published: 5 July 1996
PDF: 9 pages
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, (5 July 1996); doi: 10.1117/12.250254
Show Author Affiliations
Mark Lee, Univ. of Virginia (United States)
Steven C. Gausepohl, Univ. of Virginia (United States)
Kookrin Char, Conductus, Inc. (United States)


Published in SPIE Proceedings Vol. 2697:
Oxide Superconductor Physics and Nano-Engineering II
Ivan Bozovic; Davor Pavuna, Editor(s)

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