Share Email Print

Proceedings Paper

Low-energy oxygen ion beam assisted growth of BaO/EuBa2Cu3O7-δ multilayers in ultrahigh vacuum
Author(s): Govind Pindoria; K. Kawaguchi; Tadataka Morishita
Format Member Price Non-Member Price
PDF $14.40 $18.00

Paper Abstract

Molecular beam epitaxial growth of cuprate oxide superconducting thin films using a mass separated, low energy, O+ beam source, is discussed. The mono-valent O+ ion is chemically, highly reactive, and its kinetic energy at 10's of electron volts, is significant. It allows the growth of REBa2Cu3O7-(delta ) (REBCO) thin films at low pressures and temperatures. The effective over-pressure of the O+ ions at the substrate being 2 X 10-7 Torr, and the optimum growth temperature 500 degrees C. These conditions are below the currently accepted stability line for the growth of REBCO thin films. We characterize the physical and chemical properties of the O+ ion beam, and its effect on superconducting thin films. We have grown highly crystalline BaO and EuBa2Cu3O7-(delta ) (EBCO) thin films on SrTiO3 substrates. The full width at half maximum of the rocking curves for BaO(002) equals 0.07 degrees and that for the EBCO (005) peak equals 0.05 degrees. Also, we found that BaO is a good insulating material (1.7 X 1013 (Omega) m at 4K), with an excellent lattice match to EBCO, therefore a suitable candidate as an insulating layer in multilayer structures. The results of the first growth studies of BaO/EBCO multilayers are discussed.

Paper Details

Date Published: 5 July 1996
PDF: 12 pages
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, (5 July 1996); doi: 10.1117/12.250245
Show Author Affiliations
Govind Pindoria, International Superconductivity Technology Ctr. (Japan)
K. Kawaguchi, International Superconductivity Technology Ctr. (Japan)
Tadataka Morishita, International Superconductivity Technology Ctr. (Japan)

Published in SPIE Proceedings Vol. 2697:
Oxide Superconductor Physics and Nano-Engineering II
Ivan Bozovic; Davor Pavuna, Editor(s)

© SPIE. Terms of Use
Back to Top