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Proceedings Paper

Stress relaxation and critical layer thickness of high-temperature superconductor thin films, heterostructures, and superlattices
Author(s): Jean-Pierre Contour; A. Abert; Arnaud Defossez
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Paper Abstract

The heteroepitaxial growth of high temperature superconductor thin films on single crystal substrates produces strained heterostructures when the mismatch is small and the thickness of the epilayer is not large. ALthough a large number of studies have been carried out in the case of semiconductor epitaxy, only a few papers report models or experimental results dealing with the relaxation of the elastic strain in cuprate heterostructures. We apply here the calculations performed for semiconductor epitaxial layers and pseudomorphic superlattices to estimate the critical layer thickness of cuprate thin films, heterostructures and superlattices. The result of these calculations is discussed with respect to the previously reported data and also to our results in the case of YBaCuO heterostructures.

Paper Details

Date Published: 5 July 1996
PDF: 11 pages
Proc. SPIE 2697, Oxide Superconductor Physics and Nano-Engineering II, (5 July 1996); doi: 10.1117/12.250242
Show Author Affiliations
Jean-Pierre Contour, CNRS/Thomson CSF-LCR (France)
A. Abert, CNRS/Thomson CSF-LCR (France) and Univ. Konstanz (Germany)
Arnaud Defossez, Ecole Superieure de Physique et Chimie Industrielles (France)


Published in SPIE Proceedings Vol. 2697:
Oxide Superconductor Physics and Nano-Engineering II
Ivan Bozovic; Davor Pavuna, Editor(s)

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