Share Email Print

Proceedings Paper

Image quality evaluation of target surface in the subgrade settlement monitoring system
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The accuracy of the detection in the image-based subgrade settlement monitoring system depend on the quality of the collected spot image, This paper studies the main factors affecting the quality of spot images and propose a method for quality assessment of spot image without reference. The method analyze the characteristics of the spot change under the influence of external conditions, and reflect the change effect of the spot feature through the size, brightness, edge definition and contrast of the spot image.Then,the four evaluation factors are integrated into one. Through the experiment, the spot images under the influence of the target surface are collected. The spot image obtained by the experiment is evaluated using the non-reference spot image evaluation method proposed in this paper, and verifies by measuring the center position of the spot image. The experimental results show that the spot image is affected by different influencing factors, this evaluation method method can combine various influencing factors to reflect the change of image quality,and can give reasonable evaluation results for spot images that are affected to varying degrees. It provides theoretical and experimental basis for the actual subgrade surface settlement monitoring system.

Paper Details

Date Published: 6 November 2018
PDF: 10 pages
Proc. SPIE 10812, Semiconductor Lasers and Applications VIII, 1081208 (6 November 2018); doi: 10.1117/12.2502302
Show Author Affiliations
Tao Jia, Lanzhou Jiaotong Univ. (China)
Yongzhi Min, Lanzhou Jiaotong Univ. (China)
Jianwu Dang, Lanzhou Jiaotong Univ. (China)
Gansu Provincial Engineering Research Ctr. for Artificial Intelligence and Graphics and Image Processing (China)
Weizhuo Ren, Lanzhou Jiaotong Univ. (China)
Banghuan Lv, Lanzhou Jiaotong Univ. (China)

Published in SPIE Proceedings Vol. 10812:
Semiconductor Lasers and Applications VIII
Ning Hua Zhu; Werner H. Hofmann, Editor(s)

© SPIE. Terms of Use
Back to Top