Share Email Print
cover

Proceedings Paper

Modulated rubidium-cesium laser system with dual wavelengths
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

It is believable that a diode pumped alkali laser (DPAL) will generate a continue-wave (CW) high-powered output in the near future. In this paper, we report the first experimental demonstration of modulating a laser-pumped rubidium-cesium vapor laser system with two wavelengths. Being different from the conventional dual-wavelength solid-state lasers in which stimulated emissions with two wavelengths often interfere with each other, the rubidium-cesium vapor laser with two wavelengths, i.e. 794.736 nm for rubidium and 894.335 nm for cesium, has a prominent advantage of employing different alkali metal vapors as laser media in the same oscillator without any disturbance in the lasing processes for dual wavelengths. In the study, we also modulated one pump source and kept the other pump source unchanged in time domain. The experimental results reveal that such a rubidium-cesium vapor laser may provide a new light source for the applications in the fields of laser ranging, laser radar, and laser surface depiction.

Paper Details

Date Published: 7 November 2018
PDF: 6 pages
Proc. SPIE 10819, Optical Metrology and Inspection for Industrial Applications V, 1081904 (7 November 2018); doi: 10.1117/12.2502280
Show Author Affiliations
Qiang Yu, Southwest Institute of Technical Physics (China)
Shunyan Wang, Southwest Institute of Technical Physics (China)
Niyaziaili Nulahemaiti, Xinjiang Univ. (China)
Wei Zhang, Southwest Institute of Technical Physics (China)
Juhong Han, Southwest Institute of Technical Physics (China)
Guofei An, Southwest Institute of Technical Physics (China)
Kang Dai, Xinjiang Univ. (China)
He Cai, Southwest Institute of Technical Physics (China)
Abai Alghazi, Xinjiang Univ. (China)
You Wang, Southwest Institute of Technical Physics (China)


Published in SPIE Proceedings Vol. 10819:
Optical Metrology and Inspection for Industrial Applications V
Sen Han; Toru Yoshizawa; Song Zhang, Editor(s)

© SPIE. Terms of Use
Back to Top