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Spectrally resolved wavefront measurements on broad-band dielectric coatings
Author(s): Klaus Mann; Bernd Schäfer; Jennifer Zimara; Michael Vergöhl; Chris Britze; Stefan Bruns; Volker Kirschner
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Paper Abstract

In this work the influence of non-uniformity effects on the spectral transmission properties of broad-band dielectric optical coatings was examined. Recently, it was observed that in modern complex dielectric coatings significant spectral, resonantlike errors of the reflected wavefront can occur at specific wavelengths, which are induced by lateral coating nonuniformities [1]. For a detailed investigation of this effect, a setup was developed for monitoring the spectrally dependent wavefront error, utilizing a broad-band monochromatized plasma lamp (spectral range from 400 – 900nm) as light source and a high sensitivity Hartmann-Shack wavefront sensor for detection of reflected or transmitted wavefronts. In addition, a method for absolute and relative calibration of the measured wavefront error is presented. Two broadband dielectric beam splitters (#1 and #2) deposited by magnetron sputtering (high reflectance 400 – 900 nm, high transmittance 920 – 2300 nm) with different coating specifications were analyzed. It could be shown, that for an optimized design the spectral wavefront error can be significantly reduced compared to a standard beam splitter design [2].

Paper Details

Date Published: 16 November 2018
PDF: 6 pages
Proc. SPIE 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference, 108052F (16 November 2018); doi: 10.1117/12.2502052
Show Author Affiliations
Klaus Mann, Laser-Lab. Göttingen e.V. (Germany)
Bernd Schäfer, Laser-Lab. Göttingen e.V. (Germany)
Jennifer Zimara, Laser-Lab. Göttingen e.V. (Germany)
Michael Vergöhl, Fraunhofer-Institut für Schicht- und Oberflächentechnik (Germany)
Chris Britze, Fraunhofer-Institut für Schicht- und Oberflächentechnik (Germany)
Stefan Bruns, Fraunhofer-Institut für Schicht- und Oberflächentechnik (Germany)
Volker Kirschner, European Space Research and Technology Ctr. (Netherlands)


Published in SPIE Proceedings Vol. 10805:
Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
Christopher Wren Carr; Gregory J. Exarhos; Vitaly E. Gruzdev; Detlev Ristau; M.J. Soileau, Editor(s)

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