Share Email Print
cover

Proceedings Paper

Single-particle detection using high-refractive index film coated in microring resonator
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Detection of the particle especially the nanoparticle attracts much attention in various fields from analysis of various biological materials to environmental monitoring. Microring resonator coated with high refractive index film provides a structure supporting whispering-gallery-modes (WGMs) due to the contrast of the refractive index. This structure can be used as a microfluidic detection and indication of the binding of nanoparticles. In this work, we numerically investigated and optimized this microring resonator, pursuing high quality factors 106, yielding the intense light and analyte interactions, as well as extremely high sensitivity and low detection limit. For a single particle adhered to the inner surface of the microring, the eigenmode were investigated. The symmetric and asymmetric modes located the particle at the antinode and node due to the backscattered light coupling between the clockwise and counter-clockwise propagation the WGMs. This leads to the original degenerate resonance mode splitting in frequency. The electric-field intensity distributions along the radius direction near to the film for the fundamental mode and higher order mode were simulated with and without particles. We found that the significant of splitting for the fundamental mode (~ 0.010 THz) due to the scatter of the particles was very different with the separation between fundamental mode and high order mode (~ 1 THz). In addition, the splitting in changed with the size and number of the particle were obtained and the sizes of the particles were estimated which consistent with those in design

Paper Details

Date Published: 2 November 2018
PDF: 8 pages
Proc. SPIE 10818, Holography, Diffractive Optics, and Applications VIII, 108180A (2 November 2018); doi: 10.1117/12.2501765
Show Author Affiliations
Zhi-Hong Zhang, Univ. of Electronic Science and Technology of China (China)
Mu-Neng Li, Univ. of Electronic Science and Technology of China (China)
Feng-Ji Gui, Univ. of Electronic Science and Technology of China (China)
Si-Hui Shang, Univ. of Electronic Science and Technology of China (China)


Published in SPIE Proceedings Vol. 10818:
Holography, Diffractive Optics, and Applications VIII
Yunlong Sheng; Chongxiu Yu; Changhe Zhou, Editor(s)

© SPIE. Terms of Use
Back to Top