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Proceedings Paper

Technology and characterization of HgCdTe photodiode with a strengthened passivation
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Paper Abstract

This paper describes the technology and characterization of HgCdTe photodetectors developed in Vigo System S.A.. Four different variations of devices have been made which include different substrate types and different passivation coatings. CdTe passivation and anodization have been compared. Additionally, both passivations have been strengthened using a negative photoresist SU-8. As fabricated devices have been destined to work as infrared radiation detectors, there has been performed a current measurement for reverse polarization. Based on current-voltage characteristics, current densities have been calculated and compared among fabricated photodiodes to find the best solution of examined passivations.

Paper Details

Date Published: 1 October 2018
PDF: 5 pages
Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 108080V (1 October 2018); doi: 10.1117/12.2501591
Show Author Affiliations
A. Pedryc, Lublin Univ. of Technology (Poland)
A. Martychowiec, Lublin Univ. of Technology (Poland)
A. Kociubiński, Lublin Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 10808:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018
Ryszard S. Romaniuk; Maciej Linczuk, Editor(s)

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