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Proceedings Paper

Method of evaluating the level of confidence based on metrological risks for determining the coverage factor in the concept of uncertainty
Author(s): Oleksandr Vasilevskyi; Volodymyr Didych; Anna Kravchenko; Maksym Yakovlev; Iryna Andrikevych; Dmytro Kompanets; Yevhen Danylyuk; Waldemar Wójcik; Askhat Nurmakhambetov
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Paper Abstract

A method for estimating the level of confidence for determining the coverage factor based on metrological risks is proposed using the example of using information on tolerances and uncertainty of measuring the activity of ions, which allows to establish a reasonable interval around the measurement result, within which most of the values that can be justified are assigned to the measured value.

Paper Details

Date Published: 1 October 2018
PDF: 6 pages
Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 108082C (1 October 2018); doi: 10.1117/12.2501576
Show Author Affiliations
Oleksandr Vasilevskyi, Vinnytsia National Technical Univ. (Ukraine)
Volodymyr Didych, Vinnytsia National Medical Univ. (Ukraine)
Anna Kravchenko, National Univ. of Life and Environmental Sciences of Ukraine (Ukraine)
Maksym Yakovlev, Hetman Petro Sahaidachny National Army Academy (Ukraine)
Iryna Andrikevych, Vinnytsia National Medical Univ. (Ukraine)
Dmytro Kompanets, Vinnytsia National Technical Univ. (Ukraine)
Yevhen Danylyuk, Vinnytsia National Technical Univ. (Ukraine)
Waldemar Wójcik, Lublin Univ. of Technology (Poland)
Askhat Nurmakhambetov, Kazakh Academy of Transport and Communication (Kazakhstan)


Published in SPIE Proceedings Vol. 10808:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018
Ryszard S. Romaniuk; Maciej Linczuk, Editor(s)

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