Share Email Print
cover

Proceedings Paper

Correction of dynamic characteristics of temperature measuring devices
Author(s): O. Boyko; O. Hotra
Format Member Price Non-Member Price
PDF $14.40 $18.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

The correction method of dynamic characteristics of temperature measuring devices is proposed. It is based on the measurement of the RTD’s resistance value at a certain moment of the beginning of the transition process with subsequent calculation (by developed algorithm) of the given RTD’s resistance value corresponding to the measured temperature value. The structural scheme of the thermoresistive converter with the RTD pre-heating to the initial temperature value of the measuring range and with microprocessor calculation of the measured temperature value has been developed. The accuracy of temperature determination in this case is mainly determined by the accuracy of temperature measurement at a time instant t of the transition process beginning chosen less than the time constant of the RTD t <τ . It has been found that the proposed temperature measuring device provides the measurement accuracy of 0.05 °C at the measurement time t=0.1τ.

Paper Details

Date Published: 1 October 2018
PDF: 7 pages
Proc. SPIE 10808, Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018, 1080858 (1 October 2018); doi: 10.1117/12.2501553
Show Author Affiliations
O. Boyko, Lviv National Medical Univ. (Ukraine)
O. Hotra, Lublin Univ. of Technology (Poland)


Published in SPIE Proceedings Vol. 10808:
Photonics Applications in Astronomy, Communications, Industry, and High-Energy Physics Experiments 2018
Ryszard S. Romaniuk; Maciej Linczuk, Editor(s)

© SPIE. Terms of Use
Back to Top