Share Email Print

Proceedings Paper

Numerical and experimental analysis of Bessel beam properties based on continuous-wave terahertz radiation
Format Member Price Non-Member Price
PDF $17.00 $21.00
cover GOOD NEWS! Your organization subscribes to the SPIE Digital Library. You may be able to download this paper for free. Check Access

Paper Abstract

Terahertz imaging technology has been widely used in various fields. In continuous-wave terahertz imaging system, when the large size object is located at the unfocused position, Bessel beam with non-diffractive properties show its large depth of focus advantage over Gaussian beam. Bessel beam can be generated by the axicon, which has high conversion efficiency. The non-diffraction distance and the main lobe size of the Bessel beam depend on the parameters of the axicon and incident light wavelength. We analyzed that the influence on the axial two-dimensional intensity distribution of a zero-order Bessel beam by changing the axicon parameters and the incident Gaussian beam size. Experimentally, the axicon with different parameters were fabricated using different materials. Then the two-dimensional intensity distribution of the Bessel beam in the axial and transverse direction were recorded and analyzed. The experimental results is basically consistent with the theoretical ones.

Paper Details

Date Published: 9 November 2018
PDF: 9 pages
Proc. SPIE 10826, Infrared, Millimeter-Wave, and Terahertz Technologies V, 108261C (9 November 2018); doi: 10.1117/12.2501241
Show Author Affiliations
Zhihao Xu, Beijing Univ. of Technology (China)
Lu Rong, Beijing Univ. of Technology (China)
Dayong Wang, Beijing Univ. of Technology (China)
Bin Li, Beijing Univ. of Technology (China)
Yanlin Zhao, Beijing Univ. of Technology (China)
Jie Zhao, Beijing Univ. of Technology (China)
Yunxin Wang, Beijing Univ. of Technology (China)

Published in SPIE Proceedings Vol. 10826:
Infrared, Millimeter-Wave, and Terahertz Technologies V
Cunlin Zhang; Xi-Cheng Zhang; Masahiko Tani, Editor(s)

© SPIE. Terms of Use
Back to Top