Share Email Print

Proceedings Paper

Structural, morphological, and optical studies of Rutile-phase TiO2 rods grown on F:SnO2-coated glass substrate by hydrothermal chemical bath deposition
Author(s): Crispin M. Mbulanga; Zelalem N. Urgessa; Stive R. Tankio Djiokap; Japie A. A. Engelbrecht; Richard Betz; Johannes R. Botha
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Structural, morphological and optical studies of rutile-phase TiO2 rods, grown on F:SnO2-coated glass substrates, using hydrothermal chemical bath deposition, are reported. The methods used to determine the optical properties of a semiconductor-on-substrate two-medium system have been successfully applied to the following three-medium structure: vertically well-aligned rods of TiO2, an F:SnO2 (FTO) conducting thin film and a glass substrate. Reflectance fringe measurements yielded the thickness of the TiO2 layer to be d = 4.2 μm, which agreed well with the length of rods observed using SEM. The F:SnO2 thickness of 569 nm measured from reflectance fringe spacings also agreed with SEM measurements. A room temperature absorption edge of Eg = 2.90 eV was obtained for the top layer of TiO2 rods, which is similar to other values reported for TiO2. A room temperature absorption edge of Eg = 3.56 eV was determined for the conducting F:SnO2 layer.

Paper Details

Date Published: 24 January 2019
PDF: 8 pages
Proc. SPIE 11043, Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 110430R (24 January 2019); doi: 10.1117/12.2501108
Show Author Affiliations
Crispin M. Mbulanga, Nelson Mandela Univ. (South Africa)
Zelalem N. Urgessa, Nelson Mandela Univ. (South Africa)
Stive R. Tankio Djiokap, Nelson Mandela Univ. (South Africa)
Japie A. A. Engelbrecht, Nelson Mandela Univ. (South Africa)
Richard Betz, Nelson Mandela Univ. (South Africa)
Johannes R. Botha, Nelson Mandela Univ. (South Africa)

Published in SPIE Proceedings Vol. 11043:
Fifth Conference on Sensors, MEMS, and Electro-Optic Systems
Monuko du Plessis, Editor(s)

© SPIE. Terms of Use
Back to Top