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Proceedings Paper

A statistic method of project nonlinearity correction in multi-frequency phase-shifting fringe projection profilometry
Author(s): Shuo Xing; Hongwei Guo
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Paper Abstract

In fringe projection profilometry, using multi-frequency fringe patterns allows us to determine fringe orders automatically, thus unwrapping the measured phase maps. Simultaneously, doing this provides a possibility of correcting the effects of the projector nonlinearity directly from the captured fringe patterns. This projector nonlinearity decreases the measurement accuracies by inducing errors appearing as ripple-like artifacts on the phase maps and, further, on the reconstructed 3D shape surfaces. Theoretical analysis shows that these artifacts, depending on the number of phase shifts, have multiplied frequencies higher than the fringe frequencies, and their amplitudes are dependent on the extent of the projector nonlinearity. These facts imply that, we estimate the amplitude of the artifacts from two phase maps of the fringe patterns having different frequencies, by exploiting the statistics of the differences of their phase errors. By subtracting out the artifacts from the phase maps, the effects of the projector nonlinearity on the measurement results can be suppressed significantly. Experiment results demonstrate that this proposed method offers some advantages over others, such as working without a photometric calibration, being applicable when the projector nonlinearity varies with time, and being efficient in computation.

Paper Details

Date Published: 24 July 2018
PDF: 7 pages
Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 1082711 (24 July 2018); doi: 10.1117/12.2501056
Show Author Affiliations
Shuo Xing, Shanghai Univ. (China)
Hongwei Guo, Shanghai Univ. (China)

Published in SPIE Proceedings Vol. 10827:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
Yingjie Yu; Chao Zuo; Kemao Qian, Editor(s)

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