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Proceedings Paper

Systematic error correction of a gap measuring system using a multi-layer artifact
Author(s): Sen Zhou; Jian Xu; Long Wang; Lei Tao; Yueqing Ding
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Paper Abstract

This article presents a novel multi-layer artifact for systematic error correction of a gap measuring system, consisting a 3D laser scanner and motorized linear stages. This artifact representation of five-layers gap shape with continuous free-form surface was designed, which include diverse form dimensions. Then, in order to improve the measurement accuracy of the range dimension of the gaps, a one-step calibration procedure based on an experimental process has been developed. The influence of the three parameters on width error, depth error and flush error, defining the relative position and the orientation between the scanner and the range gaps, is respectively considered. The results obtained in accuracy and repeatability tests performed on this multi-layer artifact primitives attest to the viability of this correction method for gap measuring system.

Paper Details

Date Published: 23 October 2018
PDF: 7 pages
Proc. SPIE 10821, Advanced Sensor Systems and Applications VIII, 108211N (23 October 2018); doi: 10.1117/12.2501052
Show Author Affiliations
Sen Zhou, Chongqing Academy of Metrology and Quality Inspection (China)
Jian Xu, Chongqing Academy of Metrology and Quality Inspection (China)
Long Wang, Chongqing Academy of Metrology and Quality Inspection (China)
Lei Tao, Chongqing Academy of Metrology and Quality Inspection (China)
Yueqing Ding, Chongqing Academy of Metrology and Quality Inspection (China)


Published in SPIE Proceedings Vol. 10821:
Advanced Sensor Systems and Applications VIII
Tiegen Liu; Shibin Jiang, Editor(s)

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