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A method of vision localization measurement to assist Fourier ptychographic microscopy
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Paper Abstract

Fourier ptychographic microscopy (FPM) is a new imaging technology developed in recent years, which can achieve a high-resolution imaging with large field of view (FOV). In FPM, the imaging retrieval quality depends on the exact position of the LED array, and there exists position errors of LED array in practice. To obtain the accurate position, this paper proposes a method of vision assisted localization to determine the coordinates of LED array, which can provide the accurate LED ray directions for improving FPM. Additionally, a multi-resolution reference is built to settle the inconsistent FOV between the FPM system and vision assisted system. The experiments are performed to illuminate the efficiency and capability of flexible application because of no LED array aligning considered.

Paper Details

Date Published: 24 July 2018
PDF: 6 pages
Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108270J (24 July 2018); doi: 10.1117/12.2501042
Show Author Affiliations
Xiaoli Liu, Shenzhen Univ. (China)
Cheng Li, Shenzhen Univ. (China)
Qijian Tang, Shenzhen Univ. (China)
Xiang Peng, Shenzhen Univ. (China)


Published in SPIE Proceedings Vol. 10827:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
Yingjie Yu; Chao Zuo; Kemao Qian, Editor(s)

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