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Proceedings Paper

Wavelength-scanning digital holographic method
Author(s): Yilei Ding; Yingjie Yu
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Paper Abstract

Surface and internal defects of object are one of the most important reasons causing product quality problems and failures, including micro-cracks, micro-scratches, nano-deposition particles. In order to obtain the multi-layer information of the object, this paper proposes the wavelength-scanning digital holographic method. The algorithm is simulated to analyze the feasibility of acquiring the layered information of objects and the separation effect. Compared with the micro-hologram by compressive sensor, the result shows that digital holographic tomography based on wavelength scanning has a good separation effect on multi-layer object information and defects can be detected clearly.

Paper Details

Date Published: 24 July 2018
PDF: 6 pages
Proc. SPIE 10827, Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018), 108270R (24 July 2018); doi: 10.1117/12.2500864
Show Author Affiliations
Yilei Ding, Shanghai Univ. (China)
Yingjie Yu, Shanghai Univ. (China)


Published in SPIE Proceedings Vol. 10827:
Sixth International Conference on Optical and Photonic Engineering (icOPEN 2018)
Yingjie Yu; Chao Zuo; Kemao Qian, Editor(s)

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