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Proceedings Paper

Infrared and visible light image registration algorithm based on clustering and mutual information
Author(s): Feiyan Cheng; Junsheng Shi; Lijun Yun; Xiaoqiao Huang; Zaiqing Chen; Zhenhua Du
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Paper Abstract

Image registration has always been the hot topic in image research field, and the mutual information registration method has become a commonly used method in image registration because of its high precision and good robustness. Unfortunately, it has a problem for infrared and visible image registration. Lots of rich background detail information is usually provided by the visible light band, while the infrared image can locate an object (heat source) with a higher temperature, and often can't obtain the background information. The large difference in the background information of the two images not only interferes with the accuracy of the registration algorithm but also brings a lot of computation. In this paper, a method of fuzzy c-means clustering is used to separate foreground and background which reduces the background information interference for registration, based on the feature that the infrared image and the visible image have a high uniformity in the target area and a large difference in the background area. Then, the mutual information of the foreground image marked by clustering algorithm is calculated as the similarity measure to achieve the purpose of registration. Finally, the algorithm is tested by the infrared and visible images acquired actually. The results show that the two image’s registration is perfectly implemented and verify the effectiveness of this method.

Paper Details

Date Published: 8 November 2018
PDF: 10 pages
Proc. SPIE 10817, Optoelectronic Imaging and Multimedia Technology V, 108170D (8 November 2018); doi: 10.1117/12.2500763
Show Author Affiliations
Feiyan Cheng, Yunnan Normal Univ. (China)
Yunnan Key Lab. of Opto-electronic Information Technology (China)
Junsheng Shi, Yunnan Key Lab. of Opto-electronic Information Technology (China)
Lijun Yun, Yunnan Normal Univ. (China)
Yunnan Key Lab. of Opto-electronic Information Technology (China)
Xiaoqiao Huang, Yunnan Key Lab. of Opto-electronic Information Technology (China)
Zaiqing Chen, Yunnan Normal Univ. (China)
Yunnan Key Lab. of Opto-electronic Information Technology (China)
Zhenhua Du, Yunnan Key Lab. of Opto-electronic Information Technology (China)


Published in SPIE Proceedings Vol. 10817:
Optoelectronic Imaging and Multimedia Technology V
Qionghai Dai; Tsutomu Shimura, Editor(s)

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